International Research journal of Management Science and Technology
ISSN 2250 - 1959 (online) ISSN 2348 - 9367 (Print) New DOI : 10.32804/IRJMST
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THE ELECTRICAL AND OPTICAL PROPERTIES OF THE STRATIFIED TELLURIUM THIN FILMS
2 Author(s): MUKESH SHEORAN, DR. ARUNESH KUMAR
Vol - 3, Issue- 3 , Page(s) : 336 - 346 (2012 ) DOI : https://doi.org/10.32804/IRJMST
In relation to the composition of a film, the electrical and optical characteristics of Te thin films (d = 300 – 1100 nm) mounted in the vacuum on the glass substrates are studied. Furthermore, the microstructure study of the topography with an optical microscope demonstrated the highest degree of homogeneity and regularity of this film. The findings derived from this work lead to the normal reported data on X-ray.